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- iST Empowers NFU Materials Science Talent with Lecture on the Role of TEM in Semiconductors
2026
10.7
Industry Cooperation
iST Empowers NFU Materials Science Talent with Lecture on the Role of TEM in Semiconductors
iST Empowers NFU Materials Science Talent with Lecture on the Role of TEM in Semiconductors
| Dedicated to its long-term ESG commitment to cultivating next-generation talent, iST recently collaborated with the Department of Materials Science and Engineering at National Formosa University (NFU) to host an industry expert lecture titled "From Reliability and Failure Analysis to Materials Analysis: The Role of TEM in Semiconductors." The lecture provided students with a comprehensive overview of the semiconductor verification lifecycle, bridging Reliability Analysis (RA), Failure Analysis (FA), and Materials Analysis (MA), with a special focus on the indispensable role of Transmission Electron Microscopy (TEM) in advanced node characterization. The classroom saw exceptional enthusiasm, with students fully focused, eagerly raising their hands to answer questions, and actively competing in the dynamic Q&A challenges. To maximize the learning impact, the lecture was seamlessly connected with an on-site corporate lab tour at iST, giving students first-hand exposure to cutting-edge testing and analytical facilities. iST remains committed to strengthening industry-academia collaboration through guest lectures, laboratory visits, and talent programs, empowering future materials engineering professionals to drive industry innovation. |
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| Dedicated to its long-term ESG commitment to cultivating next-generation talent, iST recently collaborated with the Department of Materials Science and Engineering at National Formosa University (NFU) to host an industry expert lecture titled "From Reliability and Failure Analysis to Materials Analysis: The Role of TEM in Semiconductors." The lecture provided students with a comprehensive overview of the semiconductor verification lifecycle, bridging Reliability Analysis (RA), Failure Analysis (FA), and Materials Analysis (MA), with a special focus on the indispensable role of Transmission Electron Microscopy (TEM) in advanced node characterization. The classroom saw exceptional enthusiasm, with students fully focused, eagerly raising their hands to answer questions, and actively competing in the dynamic Q&A challenges. To maximize the learning impact, the lecture was seamlessly connected with an on-site corporate lab tour at iST, giving students first-hand exposure to cutting-edge testing and analytical facilities. iST remains committed to strengthening industry-academia collaboration through guest lectures, laboratory visits, and talent programs, empowering future materials engineering professionals to drive industry innovation. |
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